Scanning head for eddy-current testing, method for processing a scanning head for an eddy-current test method

US6452384B1 · kind B1 · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Erich Becker · Springe, DE
• Hans-Peter Lohmann · Wesel, DE
• Gabriel Daalmans · Edenkoben, DE
• Klaus Ludwig · Erlangen, DE
• Ludwig Bär · Erlangen, DE

Key dates

• Filing date: May 4, 2000
• Grant date: Sep 17, 2002
• Expiry date: May 4, 2020

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N27/9006
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A scanning head for eddy-current testing includes a probe coil configuration disposed on a film on a film base. The film base is matched to a shape of an object to be tested. This allows quick, low-interference eddy-current testing. A method for producing a scanning head for an eddy-current test and an eddy-current test method are also provided.