X-ray inspection using co-planar pencil and fan beams
US6453007B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 16, 2001 |
| Grant date | Sep 17, 2002 |
| Priority date | — |
| Expiry date | Feb 22, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection system is for inspecting an object with penetrating radiation. A source of penetrating radiation provides a beam of radiation. The beam alternates between a first beam shape and a second beam shape, the first and second beam shapes being coplanar. A first detector arrangement is for detecting penetrating radiation from a portion of the beam transmitted through the object and generating a transmitted radiation signal. A second detector arrangement is for detecting penetrating radiation from a portion of the beam scattered by the object and generating a scattered radiation signal. A processor determines at least one characteristic of the object based at least on the transmitted and scattered radiation signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.