X-ray tube life prediction method and apparatus
US6453009B2 · kind B2 · utility
17Cited by
9References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 25, 1998 |
| Grant date | Sep 17, 2002 |
| Priority date | — |
| Expiry date | Nov 25, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/54
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
Possible failure of x-ray tubes is predicted by monitoring and analysis of operating parameters considered leading indicators of failure. Historical data for a tube population is analyzed by discriminant analysis to develop a failure prediction algorithm. The algorithm is used to correlate operating parameters, or values derived from the operating parameters with a potential for tube failure. The operating parameters may include anode overcurrent events and spits, or spit rate exceeded errors for a diagnostic system in which the x-ray tube is installed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.