System and method for evaluating and calibrating a radiation generator
US6454460B1 · kind B1 · utility
Inventors
Key dates
| Filing date | Sep 8, 1998 |
| Grant date | Sep 24, 2002 |
| Priority date | — |
| Expiry date | Sep 8, 2018 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and multipurpose apparatus that can evaluate an x-ray system performance for the purposes of quality assurance testing, servicing, optimization of technique factors and on-line x-ray source control. The apparatus offers self-consistent evaluation of kVp (Kilovolts Peak), Half Value Layers (HVL), x-ray exposure or kerma, exposure time, relative or calibrated mA, rise time, fall time, ripple factor and automatic identification of voltage or current spikes and break downs in a single x-ray exposure. This apparatus, by measuring radiation parameters from the same exposure, provides an accurate determination of parameters overcoming inconsistencies present in the traditional method of using several exposures. This apparatus uses a multiple sensor assembly with computer controlled electronics for optimization of signal conditioning and operational parameters. A filter package with varying material and thickness of x-ray attenuators in positions corresponding to sensors is used for self-consistent determination of kVp, mA, etc.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.