Patent · US Expired

Semiconductor radiation detector

US6455858B1 · kind B1 · utility

12Cited by
7References
43Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 13, 2000
Grant dateSep 24, 2002
Priority date
Expiry dateNov 27, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2224/48091

Abstract

A semiconductor radiation detector is provided to detect x-ray and light photons. The entrance electrode is segmented by using variable doping concentrations. Further, the entrance electrode is physically segmented by inserting n+ regions between p+ regions. The p+ regions and the n+ regions are individually biased. The detector elements can be used in an array, and the p+ regions and the n+ regions can be biased by applying potential at a single point. The back side of the semiconductor radiation detector has an n+ anode for collecting created charges and a number of p+ cathodes. Biased n+ inserts can be placed between the p+ cathodes, and an internal resistor divider can be used to bias the n+ inserts as well as the p+ cathodes. A polysilicon spiral guard can be implemented surrounding the active area of the entrance electrode or surrounding an array of entrance electrodes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.