Test piece analyzing apparatus
US6455865B2 · kind B2 · utility
0Cited by
5References
6Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Apr 30, 2001 |
| Grant date | Sep 24, 2002 |
| Priority date | — |
| Expiry date | Apr 30, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2035/00128
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test piece analyzing apparatus is provided which includes a releasably fixed absorbent member, a horizontally reciprocative pinching mechanism for simultaneously transferring a plurality of test pieces in a transfer direction, and an optical analyzing assembly provided with a primary illuminator and a secondary illuminator. The second illuminator serves to illuminate the bottom surface of the test piece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.