Method and apparatus for correcting electronic offset and gain variations in a solid state X-ray detector
US6457861B1 · kind B1 · utility
16Cited by
2References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 15, 2000 |
| Grant date | Oct 1, 2002 |
| Priority date | — |
| Expiry date | Nov 16, 2020 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/583
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A method and apparatus for correcting electronic offset and gain variations in solid state x-ray detectors includes dedicating rows at the end of an x-ray detector scan. The dedicated rows may be used to measure the “signal” induced by electronic offset and gain variations in solid state x-ray detectors. The first row may be used to measure the signal induced by electronic offset. The second row may be used to measure to signal induced by gain variations. Measurements of the induced signals taken from the dedicated rows may be used to eliminate structured artifacts from the x-ray image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.