Patent · US Expired

Method of fabricating micromachined structures and devices formed therefrom

US6458615B1 · kind B1 · utility

46Cited by
12References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 1999
Grant dateOct 1, 2002
Priority date
Expiry dateSep 30, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01P2015/084
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for fabricating a micromachined structure. The method includes forming a circuitry layer having an upper etch-resistant layer on an upper surface of a substrate, directionally etching a portion of the circuitry layer exposed by the upper etch-resistant layer, and directionally etching a portion the substrate exposed by the upper etch-resistant layer with a deep reactive ion etch.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.