Depth of interaction system in nuclear imaging
US6459085B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 26, 1999 |
| Grant date | Oct 1, 2002 |
| Priority date | — |
| Expiry date | Oct 26, 2019 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B6/037
- WIPO fieldEnvironmental technology
- WIPO sectorChemistry
Abstract
A device and method for determining the x- and y-positions, as well as the depth of interaction, of an interaction between a gamma ray and a scintillation crystal. In one embodiment, a first and a second sensor array are disposed on opposite sides of a scintillation crystal which is subjected in incident gamma radiation resulting in the release of photons. The first sensor array provides a measurement of the x- and y-positions of the interaction while the second sensor array provides a measurement of the depth-of-interaction. In one embodiment, the first sensor array is a photomultiplier array and the second sensor array is an array of wavelength-shifting fibers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.