Method for characterizing delay of frequency translation devices
US6459278B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Dec 19, 2001 |
| Grant date | Oct 1, 2002 |
| Priority date | — |
| Expiry date | Dec 19, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31858
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Absolute delay of a FTD is characterized by applying a stimulus signal to a first port of the FTD. A second port of the FTD is coupled to a delay element having a known delay and a reflective termination. A drive signal is applied to a third port of the FTD. A time domain reflection response to the stimulus signal is obtained and a signal peak within the response that corresponds to a return signal from the reflective termination is identified. Absolute delay of the frequency translation device is then extracted based on the known delay of the delay element and a time that corresponds to the occurrence of the identified signal peak. Delay versus frequency is characterized by isolating a segment of the obtained time domain reflection response that corresponds to a return signal from the reflective termination. Inverse frequency transforming the isolated segment of the time domain reflection response provides delay characteristics of the FTD versus frequency. Inherent transform/inverse transform relationships between the frequency domain and the time domain enables the delay characteristics of the FTD to be provided in equivalent alternative ways.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.