Patent · US Expired

Semiconductor integrated circuit and data processing system

US6459621B1 · kind B1 · utility

29Cited by
2References
31Claims
0Family size

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Key dates

Filing dateAug 17, 2001
Grant dateOct 1, 2002
Priority date
Expiry dateAug 17, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5642
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A control of a flash memory includes control for supplying a pulse-shaped voltage to each of non-volatile memory cells until a threshold voltage of the non-volatile memory cell having a first threshold voltage is changed to a second threshold voltage. The control involves a first write mode (coarse write) in which the amount of change in threshold voltage of each non-volatile memory cell, which is varied each time the pulse-shaped voltage is applied, is relatively rendered high, and a second write mode (high-accuracy write) in which the amount of change in threshold voltage thereof is relatively rendered low. As compared with the high-accuracy mode, the number of pulses required to change the threshold voltage of each memory cell is smaller than that in the coarse write mode. Therefore, the number of verify operations at the time that the coarse write mode is used, is small and hence the entire write operation can be speeded up.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.