Spectrally shaped x-ray inspection system
US6459761B1 · kind B1 · utility
238Cited by
10References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 10, 2000 |
| Grant date | Oct 1, 2002 |
| Priority date | — |
| Expiry date | Feb 10, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/224
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system and methods for non-invasive x-ray inspection of an enclosure in such a manner as to reduce the ambient radiation dose to below a specified level. A beam spectrally filtered to emphasize a high-energy component of penetrating radiation is interleaved, temporally, with a beam dominated by a low-energy component. Thus both lightly loaded and heavily loaded cargo may be inspected while limiting the ambient scattered radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.