Patent · US Expired

Method for event analysis at an intelligent electronic device

US6459997B1 · kind B1 · utility

48Cited by
11References
50Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 28, 1998
Grant dateOct 1, 2002
Priority date
Expiry dateDec 28, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH02H1/00
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method of event analysis in an intelligent electronic device is presented. The intelligent electronic device includes a microprocessor and associated memories. An algorithm (program) stored in a memory of the intelligent electronic device analyzes events of an electrical distribution system at the intelligent electronic device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.