Method and apparatus for calibrating a non-contact gauging sensor with respect to an external coordinate system
US6460004B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 16, 2001 |
| Grant date | Oct 1, 2002 |
| Priority date | — |
| Expiry date | Mar 11, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/66
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A calibration system is provided for calibrating a sensor with respect to an external reference frame associated with manufacturing gauging station. A target calibration device is positioned at a vantage point to detect and calibrate its reference frame in relation to the external reference frame. A reference target having at least three non-coplanar reflective surfaces is illuminated by the structured light emanating from the sensor. In this way, the calibration system is able to determine the spatial location and orientation of the reference target in relation to the sensor. The calibration system further includes a coordinate transformation system for coordinating the measurement data from the target calibration device and from the feature sensor, whereby the feature sensor is calibrated with respect to the external reference frame.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.