Multi-wavelength etalon
US6462876B1 · kind B1 · utility
4Cited by
8References
7Claims
0Family size
Assignee
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Key dates
| Filing date | Nov 16, 1999 |
| Grant date | Oct 8, 2002 |
| Priority date | — |
| Expiry date | Nov 16, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A multi-wavelength etalon comprises at least two regions with different indices of refraction. The change in refractive index alters the wavelengths of incident light, and thus the number of wavelengths between the reflective surfaces of the etalon, and therefore the etalon's transmission characteristics. By selecting specific indices of refraction, an etalon can be provided which produces peaks and troughs at preselected wavelengths in each region. The transition between two adjacent regions with different indices of refraction can be graded to reduce optical interference which may result from an abrupt transition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.