Apparatus and method for compensating for pixel non-uniformity in a bolometer
US6465785B1 · kind B1 · utility
65Cited by
11References
24Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 5, 2000 |
| Grant date | Oct 15, 2002 |
| Priority date | — |
| Expiry date | May 5, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J5/20
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
In accordance with the present invention, a microbolometer focal plane array is provided with at least one thermally-shorted microbolometer detector that is thermally shorted to the microbolometer focal plane array substrate. A characteristic relationship is empirically derived for determining a corrected resistance value for each detector of the microbolometer focal plane array in response to radiation from a target scene as a function of the corresponding detector resistance value, the thermally-shorted microbolometer detector resistance value, and the empirically derived characteristic relationship.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.