Patent · US Expired

Method for creating a process capability database

US6466927B1 · kind B1 · utility

4Cited by
3References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 10, 1999
Grant dateOct 15, 2002
Priority date
Expiry dateNov 10, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06N5/022
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A procedure and method for eliciting expert information on process capability and thereafter manipulating the elicited information in such a manner that it can effectively be used in a process capability database that is operating in a six sigma regime. The manipulation preferably includes converting the expert elicited information from a tolerance-type metric to a short term standard deviation (or sigma) metric, whereby the result of the manipulation is used to populate directly a process capability database and, as appropriate, thereby augment, replace or modulate the data already stored therein.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.