&egr;-discrepant self-test technique
US6467067B1 · kind B1 · utility
1Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2001 |
| Grant date | Oct 15, 2002 |
| Priority date | — |
| Expiry date | Jun 12, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3183
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test signal is propagated through at least a portion of the circuit from a respective input. The test signal is based on a row of a k-wise, &egr;-discrepant matrix. Cells are identified whose outputs have a constant response to the test signal and the inputs of the identified cells are combined with the inputs of the circuit. The process is iteratively repeated until the output of the circuit is reached. The circuit inputs and inputs of identified cells are selected as test points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.