Applying x-ray topography and diffractometry to improve protein crystal growth
US6468346B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 2000 |
| Grant date | Oct 22, 2002 |
| Priority date | — |
| Expiry date | Dec 11, 2020 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S117/901
- WIPO fieldSurface technology, coating
- WIPO sectorChemistry
Abstract
This invention is a method for identifying conditions for growing protein crystals giving improved protein crystal growth. Crystals of a protein are grown under different sets of predetermined conditions, and x-ray topographic images of the protein crystals are generated to identify the set(s) of conditions that produce crystals having the fewest crystal defects. In a preferred embodiment, the protein crystals are grown in a dynamically controlled crystallization system. An important condition of crystal growth that can be optimized by the method of the invention is the effective gravity, geff, experienced by the growing crystal; for example, when the crystal is grown in a powerful magnetic field that causes the protein molecules in the growing crystal to experience acceleration of an effective gravitational field that is greater or less than the actual gravitational field at the earth's surface. The method further includes using x-ray crystallography to solve the structure of the protein in a crystal found by x-ray topography to have fewer defects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.