Patent · US Expired

Method for producing semiconductor temperature sensor

US6468825B1 · kind B1 · utility

14Cited by
14References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 11, 2000
Grant dateOct 22, 2002
Priority date
Expiry dateFeb 11, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/642

Abstract

A method for producing a semiconductor temperature sensor comprises the steps of forming PNP bipolar transistors and PMOS transistors so that a base region of each of the PNP bipolar transistors and a corresponding N-well region of each of the PMOS transistors are formed at the same time, and connecting the PNP bipolar transistors in a Darlington connection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.