Patent · US Expired

Method and apparatus to control device temperature

US6470238B1 · kind B1 · utility

44Cited by
7References
56Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 17, 1999
Grant dateOct 22, 2002
Priority date
Expiry dateJun 17, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F13/1668
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for controlling device temperature. The method involves determining access rate to a component, comparing the access rate with a predetermined threshold modified by a weighted value and controlling the temperature of the component through corrective action.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.