Patent · US Expired

High throughput screening method and apparatus

US6472144B2 · kind B2 · utility

43Cited by
2References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 20, 2001
Grant dateOct 29, 2002
Priority date
Expiry dateMar 20, 2021

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC40B60/14
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

High-throughput screening method and apparatus are described. The method includes placing cells on a substrate defining a plurality of discrete microwells, at a well density of greater than about 100/cm2, with the number of cells in each well being less than about 1000, and where the cells in each well have been exposed to a selected agent. The change in conductance in each well is determined by applying a low-voltage, AC signal across a pair of electrodes paced in that well, and synchronously measuring the conductance across the electrodes, to monitor the level of growth or metabolic activity of cells contained in each well. Also disclosed is an apparatus for carrying out the screening method.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.