Method and apparatus for measuring and characterizing the frequency dependent electrical properties of dielectric materials

US6472885B1 · kind B1 · utility

Inventors

• Christopher Green · Austin, US
• Jeffrey Max Seligman · Tucson, US

Key dates

• Filing date: Oct 16, 2000
• Grant date: Oct 29, 2002
• Expiry date: Oct 16, 2020

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R27/2617
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method and apparatus for measuring complex permittivity of dielectric materials in solid, liquid, or gas form. The apparatus is includes a TEM or quasi-TEM transmission line test fixture, which contains the dielectric material under test, a set of unique reflective load assemblies for inducing reflections in the fixture, an analyzer that measures magnitude and phase, a custom calibration kit, and a computer with computational software. The method begins by sequentially placing the set of load assemblies at the input of the analyzer. One port s-parameters are then obtained. Next, the set of load assemblies is sequentially placed at one end of the test fixture while the other end of the fixture is placed at the input of the analyzer and one port s-parameters are then obtained. Connectors are coupled to both ends of the fixture. A computer then executes a program to solve a set of equations constructed from the s-parameter data for computing input reflection coefficients. The program also de-embeds and mathematically curve-fits a specified electrical model of the transmission line to best replicate the reflection coefficients. Complex permittivity is calculated from the computed imp…