Patent · US Expired

Micromechanical rate of rotation sensor (DRS)

US6474162B1 · kind B1 · utility

13Cited by
14References
24Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 9, 1998
Grant dateNov 5, 2002
Priority date
Expiry dateOct 20, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01C19/5621
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A rate of rotation sensor is suggested which is structured out of silicon (silicon compounds or silicon/glass compounds) or other semiconductor materials by means of micromechanical techniques. The rate of rotation sensor has the form of a tuning fork whose prongs are situated in planes in parallel to the surface of the semiconductor wafer. These prongs are exited to carry out vibrations in a plane perpendicular to the wafer plane. By means of a sensor element which registers the torsion of the tuning fork suspension, the angular velocity of a rotation of the sensor about an axis in parallel to the tuning fork suspension is measured.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.