Temperature compensated hall sensor for testing magnetic recording heads
US6476602B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Oct 3, 2000 |
| Grant date | Nov 5, 2002 |
| Priority date | — |
| Expiry date | Nov 23, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B2005/0016
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A head testing apparatus is provided for testing a magnetic data recording head. The apparatus includes a test volume adapted to receive the magnetic data recording head and a magnetic field source positioned to generate a magnetic field within the test volume. A Hall sensor is positioned relative to the test volume and has bias current input terminals, voltage output terminals, an operating temperature and an impedance between the bias current input terminals, which varies with the operating temperature. A bias current source is electrically coupled to the bias current input terminals and is adapted to provide a bias current, which is modulated based on the impedance of the Hall sensor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.