Analyzing signals generated by rotating machines using an order mask to select desired order components of the signals
US6477472B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 9, 2001 |
| Grant date | Nov 5, 2002 |
| Priority date | — |
| Expiry date | Oct 9, 2021 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01H1/003
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A signal analysis system and method for analyzing an input signal acquired from a mechanical system. The mechanical system may include at least one rotating apparatus. The signal analysis system may be configured to: (a) receive samples of the input signal, (b) perform an invertible joint time-frequency transform (e.g., a Gabor transform) on the samples of the input signal to produce a first array of coefficients which depend on time and frequency, (c) construct an order mask array in response to user input designed to select coefficients from the first array which correspond to one or more order components in the input signal, (d) mask the first array of coefficients with the order mask array to generate a second array of coefficients which depend on time and frequency, wherein the second array of coefficients correspond to the one or more order components in the input signal, (e) generate a time domain signal from the second array of coefficients, and (f) present the time domain signal to a user on a presentation device. The signal analysis system may generate the time domain signal from the first coefficients by performing an inverse joint time-frequency transform on the first c…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.