Sensor array for rapid materials characterization
US6477479B1 · kind B1 · utility
26Cited by
88References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 11, 1998 |
| Grant date | Nov 5, 2002 |
| Priority date | — |
| Expiry date | Dec 11, 2018 |
Classification
- Technology area (CPC C)Chemistry; Metallurgy
- CPC primaryC40B40/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A sensor-array based materials characterization apparatus for characterizing one or more material properties of at least five test samples, wherein the apparatus includes a sensor array disposed on a substrate; electronic test circuitry for sending electrical signals to and receiving electrical signals from the sensor array; electronic circuitry for routing signals between selected sensors and the electronic test circuitry; and a computer or processor electrically coupled to electronic test circuitry and electronic circuitry.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.