Patent · US Expired

Method of manufacturing interconnection structural body

US6479374B1 · kind B1 · utility

79Cited by
2References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 27, 2000
Grant dateNov 12, 2002
Priority date
Expiry dateSep 27, 2020

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02282
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Disclosed is a method for producing a circuit structure having an insulator layer comprising a porous silicon oxide thin film, which comprises (1) forming a preliminary insulator layer comprising a silicon oxide-organic polymer composite thin film formed on a substrate, which silicon oxide-organic polymer composite thin film comprises a silicon oxide having an organic polymer dispersed therein, (2) forming, in the preliminary insulator layer, a groove which defines a pattern for a circuit, (3) forming, in the groove, a metal layer which functions as a circuit, and (4) removing the organic polymer from the preliminary insulator layer to render the preliminary insulator layer porous, thereby converting the preliminary insulator layer to an insulator layer comprising a porous silicon oxide thin film. By the method of the present invention, the capacitance between mutually adjacent circuit lines (line-to-line capacitance) in the circuit structure can be lowered.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.