Application of x-ray optics to energy dispersive spectroscopy
US6479818B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Sep 17, 1999 |
| Grant date | Nov 12, 2002 |
| Priority date | — |
| Expiry date | Sep 17, 2019 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J2237/2605
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray optic is employed in combination with an energy dispersive spectroscopy (EDS) detector to enhance detection performance. Such a combined optic and detector may be employed in scanning electron microscope or environmental scanning electron microscope (ESEM) applications. The x-ray optic may be a grazing incidence optic (GIO) employed as a flux enhancing collimator for use with an EDS detector, used to perform electron beam microanalysis. It is found that the GIO in combination with an EDS provides substantial intensity gain for x-ray lines with energy below 1 keV. The GIO is also found to provide a modest focus effect, i.e., by limiting the field of view of the detector, and introduces minimal spectral effects. The combined optic and detector is useful in applications employing broad beam excitation, such as an ESEM or a system using x-ray fluorescence, to spatially limit the x-rays of interest to those within the acceptance angle of the optic.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.