Method and apparatus for testing thin-film magnetic head
US6479988B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 30, 2001 |
| Grant date | Nov 12, 2002 |
| Priority date | — |
| Expiry date | May 30, 2021 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T29/53657
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for testing a thin-film magnetic head with a MR read head element includes a step of applying a low-frequency or DC external magnetic field to the thin-film magnetic head from a stationary magnetic field generation unit, a step of executing a high-frequency amplification of an output from the MR read head element under the application of the external magnetic field to provide a high-frequency amplified signal, a step of deriving only a high-frequency component from the high-frequency amplified signal to provide a high-frequency component signal, and a step of judging whether the thin-film magnetic head occurs a noise or not by using the high-frequency component signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.