Combinational test pattern generation method and apparatus
US6480980B2 · kind B2 · utility
76Cited by
7References
26Claims
0Family size
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Inventor
Key dates
| Filing date | Mar 10, 1999 |
| Grant date | Nov 12, 2002 |
| Priority date | — |
| Expiry date | Mar 10, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318371
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus that couple a change input scan chain test pattern with an initialization scan chain test pattern such that a resultant scan chain test pattern is produced, and apply the resultant scan chain test pattern to at least one combinational logic path. In one embodiment, the coupling is achieved by interleaving the change input scan chain test pattern with the initialization scan chain test pattern. In another embodiment, the coupling is achieved by creating a constructed test pattern set from the change input and the initialization scan chain test pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.