Patent · US Expired

Method of manufacturing an electrically programmable, non-volatile memory and high-performance logic circuitry in the same semiconductor chip

US6482698B2 · kind B2 · utility

19Cited by
9References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 26, 2001
Grant dateNov 19, 2002
Priority date
Expiry dateMar 26, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B41/47

Abstract

A method for manufacturing an integrated circuit having a memory device and a logic circuit includes forming a plurality of first transistors in a first portion of a semiconductor substrate, a plurality of second transistors in a second portion of the semiconductor substrate, and a plurality of memory cells in a third portion of the semiconductor substrate. A matrix mask used for selectively removing a dielectric layer from the first and third portions of the semiconductor substrate allows dielectric to remain on a floating gate of the plurality of memory cells and on the gate electrodes of the plurality of first transistors. A control gate is then formed on the floating gate, which is separated by the dielectric. Portions of the gate electrodes for the plurality of first transistors are left free so that contact is made with the transistors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.