Mechanical gauges for quality assurance of laser peening
US6483578B1 · kind B1 · utility
5Cited by
3References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 12, 2000 |
| Grant date | Nov 19, 2002 |
| Priority date | — |
| Expiry date | Jul 28, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J1/4257
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring the quality of a laser peening process, which includes a test element, a mount for the test element, wherein the test element is mounted at a preselected point in the anticipated path of a laser pulse, the laser pulse irradiates the test element, the deflection of the test element is measured in the direction substantially perpendicular and away from the impacted surface of the test element, and the deflection measurement is compared to a previously generated chart showing the relationship between characteristics of test elements and desired material properties.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.