Patent · US Expired

Container inspection system and method of using in semiconductor manufacturing

US6484113B1 · kind B1 · utility

2Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 3, 1999
Grant dateNov 19, 2002
Priority date
Expiry dateJun 3, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/67294
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

An automatic inspecting system for detecting the presence of and identifying whether the proper replacement container has been installed at a work station in a processing line, which automatic container checking system is capable of reading identifying information on the container, e.g., a bar-code, and comparing the information read with stored information indicative of a desired identification to determine whether there is a match. In the absence of a match, an alarm or other means can be used, by way of notification of a problem or to automatically stop the processing line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.