System for measurement of selected performance characteristics of microwave components
US6484124B1 · kind B1 · utility
12Cited by
8References
64Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 22, 2000 |
| Grant date | Nov 19, 2002 |
| Priority date | — |
| Expiry date | May 22, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04B17/309
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
An improved process and apparatus for measuring performance characteristics of microwave power components. The invention involves the use of a rotating phase reference technique to improve measurement. The process and apparatus result in fast, accurate, reproducible determination of the desired properties. In addition, the apparatus of the present invention is lightweight, compact, and portable.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.