Patent · US Expired

Condition assessment of nonlinear processes

US6484132B1 · kind B1 · utility

222Cited by
13References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 2000
Grant dateNov 19, 2002
Priority date
Expiry dateMar 7, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2218/12
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

There is presented a reliable technique for measuring condition change in nonlinear data such as brain waves. The nonlinear data is filtered and discretized into windowed data sets. The system dynamics within each data set is represented by a sequence of connected phase-space points, and for each data set a distribution function is derived. New metrics are introduced that evaluate the distance between distribution functions. The metrics are properly renormalized to provide robust and sensitive relative measures of condition change. As an example, these measures can be used on EEG data, to provide timely discrimination between normal, preseizure, seizure, and post-seizure states in epileptic patients. Apparatus utilizing hardware or software to perform the method and provide an indicative output is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.