Patent · US Expired

System and method for interfacing data with a test access port of a processor

US6484275B1 · kind B1 · utility

4Cited by
12References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 26, 1999
Grant dateNov 19, 2002
Priority date
Expiry dateNov 26, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F11/2733
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A processor in accordance with the present invention includes memory that stores test data and control data. The processor also includes a test application that transmits the test data and the control data from the processor's memory to a test access port of the processor. The test access port then utilizes the test data and the control data to capture state data that defines at least one state of the processor while the processor is executing. This test data may be analyzed via conventional techniques to detect and isolate errors in the execution of the processor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.