Patent · US Expired

Method and apparatus for testing integrated circuit chips that output clocks for timing

US6486693B1 · kind B1 · utility

6Cited by
2References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 19, 2000
Grant dateNov 26, 2002
Priority date—
Expiry dateMay 19, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31937
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.