Patent · US Expired

Method and apparatus for real time yield control

US6487473B1 · kind B1 · utility

4Cited by
4References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 2, 1999
Grant dateNov 26, 2002
Priority date
Expiry dateSep 2, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T83/861
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A procedure and a device for determining yield of usable pieces from a raw material when or before the usable pieces are produced. Determination of the area of raw material is automated, and pieces of raw material are encoded with a marking indicating the area and other pertinent information. The use of proximity sensors in combination with cutting dies permits the automation of yield calculation. The results of the yield calculation can be viewed on a real time basis and provide feedback to the production process, preventing low-yield production and facilitating balanced production of pieces. Indicators permit an operator to be signaled to increase production of underproduced pieces.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.