Patent · US Expired

Socket including pressure conductive rubber and mesh for testing of ball grid array package

US6489790B1 · kind B1 · utility

18Cited by
8References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 7, 2000
Grant dateDec 3, 2002
Priority date
Expiry dateMar 7, 2020

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0483
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A socket for testing a BGA package capable of avoiding problems like deformation of external terminals of the BGA package or failing to detect a defective BGA package and a test method using the socket are provided. The socket for testing a BGA package connects solder balls (or solder bumps) as external terminals of the BGA package via a mesh, a pressure conductive rubber (PCR) as a middle connection unit, and a channel connection means of a socket board. A plane board having POGO pins or a printed circuit pattern can be used for the channel connection means.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.