Patent · US Expired

Storage device having testing function and memory testing method

US6490685B1 · kind B1 · utility

16Cited by
3References
26Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 4, 1998
Grant dateDec 3, 2002
Priority date
Expiry dateDec 4, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/08
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A flash memory includes an encoded cryptographic key “k” stored therein. A protected ROM, an external access to which is inhibited, includes a decoding program stored therein to decode the cryptographic key “k”. The cryptographic key “k” is decoded by using the decoding program. With the cryptographic key “k” as decoded, data is encrypted and stored in the flash memory. Data read out from the flash memory is output after decrypted with the cryptographic key “k.” In order to check an area having the decoding program stored therein, data which forms the decoding program is processed by using a hash function stored in the ROM, and a processing result and an expected value are compared with each other. When the processing result and the expected value matches with each other, the aforementioned area is determined as being in a normal condition.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.