Patent · US Expired

Method and apparatus for recognizing properties of a sample based on mass spectroscopy

US6492639B1 · kind B1 · utility

2Cited by

5References

20Claims

0Family size

Assignee

HKR Sensorsysteme GmbH · DE

Inventors

Gerhard Horner · Linz, AT
Siegfried Nitz · Moosburg an der Isar, DE
Brigitte Dittman · Munich, DE
Harun Parlar · Zolling, DE

Key dates

Filing date	Sep 27, 1999
Grant date	Dec 10, 2002
Priority date	—
Expiry date	Sep 27, 2019

Classification

Technology area (CPC G)Physics
CPC primaryG01N30/7206
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method and device enabling time-saving, comparative mass spectrometric analysis of serial samples corresponding to a reference, for example serial samples of a product, by conditioning by means of a reference sample and forming a pattern of a reduced number of fragment ions, said fragment ions having selected from individual mass spectrums of the same separated by gas chromatography, and forming a pattern of a reference random sample from overall mass spectrograms of several reference samples reduced accordingly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.