Apparatus and method for detecting defects in a multi-channel scan driver
US6492802B1 · kind B1 · utility
Assignee
Inventor
Key dates
| Filing date | Jul 14, 2000 |
| Grant date | Dec 10, 2002 |
| Priority date | — |
| Expiry date | Dec 20, 2020 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/68
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A technique is described for detecting defects such as short circuits in a device such as a discrete pixel detector used in a digital x-ray system. The technique employs test circuits associated with each row driver of the detector. The test circuits are enabled by a test enable input signal, and the row driver sequentially enables the rows of the detector, along with the individual test circuits. In a test sequence, output signals from the row test circuits are monitored to identify whether a defect, such as a short circuit, is likely to exist in the row or row driver. The test circuitry adds only minimal area and complexity to the row driver function, providing a high degree of test coverage at a low cost, with minimal likelihood of test circuitry-induced failures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.