Device and process for testing a reprogrammable nonvolatile memory
US6493808B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 21, 2000 |
| Grant date | Dec 10, 2002 |
| Priority date | — |
| Expiry date | Jan 21, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/46
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention relates to a device for testing a reprogramable non-volatile memory having dedicated areas protectable in reading, writing and/or erasing and whose access rights consist of configuration words (MC) saved in a configuration area of the memory, said device comprising message transmission/reception means (10) and a received message logic control unit (11) and access controls to the memory, characterized in that it comprises at least one temporary register ensuring an emulation of these access rights, so as to render access protections reversible or irreversible. The invention also relates to the process performed by said device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.