Sub-surface imaging under paints and coatings using early light spectroscopy
US6495833B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2000 |
| Grant date | Dec 17, 2002 |
| Priority date | — |
| Expiry date | Oct 4, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/359
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for non-destructively imaging surfaces through a coating, in accordance with the present invention, includes a near-infrared (NIR) light source for illuminating a coated surface. A detector is positioned in an operative relationship with the NIR light source to receive light backscattered from the coated surface and from the coating. A gating device is positioned in an operative relationship with the detector to selectively permit light to pass to the detector to measure optical characteristics of the backscattered light such that determinations of a state of a surface below the coating is determined based on the optical characteristics of the backscattered light. Methods for performing the non-destructive imaging of the present invention are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.