Method and apparatus for capacitance measurement of a dielectric medium utilizing the ratio of capacitance measurement made at different frequencies
US6496020B1 · kind B1 · utility
8Cited by
16References
19Claims
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Key dates
| Filing date | Apr 21, 2000 |
| Grant date | Dec 17, 2002 |
| Priority date | — |
| Expiry date | Apr 21, 2020 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/2605
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for analyzing a dielectric medium comprises the step of measuring, at one or more frequencies, the capacitance between a pair of electrodes immersed in the dielectric medium. The proportion of the or each capacitance measurement due to electrode polarization capacitance and/or to the residual capacitance of the dielectric medium is then determined using capacitance measurements made between the electrodes at a first frequency and at a second frequency, the ratio of the respective polarization capacitances at these two frequencies being predetermined. An apparatus for performing the method is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.