Energy dispersion x-ray fluorescence analysis of chemical subtances

US6496562B1 · kind B1 · utility

Assignee

• MERCK PATENT GESELLSCHAFT MIT BESHRANK TER HAFTUNG · DE

Inventors

• Alexander Henrich · Groß-Gerau, DE
• Hans-Helmut Itzel · Ober-Ramstadt, DE
• Peter Hoffmann · Senden, DE
• Hugo Ortner · Seeheim-Jugenheim, DE

Key dates

• Filing date: Jul 20, 2001
• Grant date: Dec 17, 2002
• Expiry date: Jul 20, 2021

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N2223/076
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a method for classifying and identifying by means of energy dispersion X-ray fluorescence analysis chemical substances whose X-ray fluorescence lines cannot be detected and which therefore cannot be classified by energy dispersion X-ray fluorescence analysis alone. Said method is characterized in that the sample to be analyzed is analyzed in its original packaging or natural state without prior processing in a sample vessel. According to the method the sample is: a) positioned in front of the measuring aperture in a sample chamber of an X-ray fluorescence apparatus; b) measured; and c) classified and identified by application of multivariate, statistical techniques to the measurement signals obtained, i.e., to the Compton and Rayleigh scattering.