Patent · US Expired

Method for measuring absolute value of thermal conductivity

US6497509B2 · kind B2 · utility

12Cited by
9References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 8, 2001
Grant dateDec 24, 2002
Priority date
Expiry dateJun 8, 2021

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/4833
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of measuring the absolute value of thermal conductivity of low thermal conducting solid materials is disclosed. Thermal conductivity and heat capacity of the sample are determined simultaneously in a single measurement with the prerequisite that these values are frequency independent. This method is realized on power-compensated differential scanning calorimeters without any modification in the measuring system. DSC is calibrated in a standard way for temperature and heat flow. The method uses temperature-time profiles consisting of one fast temperature jump of 0.5 to 2 K and an isotherm. The measuring time for each temperature is less than 1 min. As input parameters only sample thickness and contact area with the DSC furnace (or sample diameter if the sample is disk shaped) are needed together with sample mass. In addition to the sample thermal conductivity and heat capacity the effective thermal contact between sample and DSC furnace is determined.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.