Patent · US Expired

Crystallization method of amorphous silicon

US6500736B2 · kind B2 · utility

10Cited by
5References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 3, 2001
Grant dateDec 31, 2002
Priority date
Expiry dateDec 3, 2021

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02672
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of crystallizing amorphous silicon using a metal catalyst. More specifically, the method includes forming an amorphous silicon layer over a substrate, forming a plurality of metal clusters on the amorphous silicon film, forming a heat insulating layer on the amorphous silicon layer including the metal clusters, disposing a pair of electrodes on the heat insulating layer, simultaneously applying a thermal treatment and a voltage to crystallize the amorphous silicon, and removing the heat insulating layer including the electrodes from the substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.