Multiple reference electrode array for measuring open circuit potentials in artificial crevices
US6501286B1 · kind B1 · utility
3Cited by
8References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 27, 2001 |
| Grant date | Dec 31, 2002 |
| Priority date | — |
| Expiry date | Aug 27, 2021 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB33Y80/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An electrode array device for use with a conductive element to simulate a crevice that is subject to corrosive conditions. The device includes a non-conductive member and a plurality of electrodes. The non-conductive member has a face, with the member defining (i) an opening through the member, the opening passing through the face of the member, and (ii) a depression formed in the face and contiguous with at least a portion of the opening. The plurality of electrodes is embedded in the member, with each of the plurality of electrodes having a portion exposed from the member to the depression.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.